CMOS Testing: Differentiating Fault Current from Leakage Current Using AC Components

Yasser A. Ahmed

Abstract: As integrated circuit technology advances, distinguishing fault currents from leakage currents in CMOS testing becomes increasingly challenging. Traditional I_DQQ testing effectively identifies major defects but struggles to separate normal leakage from fault-induced currents, often lengthening test times. This study validates a novel approach from [1] that uses the AC components of current to detect faults, enhancing testing throughput. Through simulation, we demonstrate that this method overcomes limitations of conventional techniques by isolating fault currents with minimal delay, offering a practical solution for submicron CMOS circuits.

Keywords: current testing, IC testing, physical defects, test vectors, fault detection

How to Cite?: Yasser A. Ahmed, "CMOS Testing: Differentiating Fault Current from Leakage Current Using AC Components", Volume 14 Issue 3, March 2025, International Journal of Science and Research (IJSR), Pages: 1029-1032, https://www.ijsr.net/getabstract.php?paperid=SR25323004629, DOI: https://dx.doi.org/10.21275/SR25323004629