Electrical Properties of SiO2/PSi Hetero Junction Prepared by Electrochemical Etching Process
International Journal of Science and Research (IJSR)

International Journal of Science and Research (IJSR)
Call for Papers | Fully Refereed | Open Access | Double Blind Peer Reviewed

ISSN: 2319-7064


Downloads: 151 | Views: 330

Research Paper | Physics Science | Iraq | Volume 7 Issue 1, January 2018 | Popularity: 6.2 / 10


     

Electrical Properties of SiO2/PSi Hetero Junction Prepared by Electrochemical Etching Process

Hussain Kazaal, Ramiz Alansari, Kadhim Aadim, Wassan Dhia


Abstract: In this paper, the electrical properties of porous silicon (PSi) structure fabricated by using the electrochemical etching process in HF acid, SiO2/PSi hetero junction made by deposition of SiO2 layer on porous silicon. The dark I-V characteristics synthesized by electrochemical etching are presented of hetero junction showed are strong depended on etching time. The ideality factor and saturation current of hetero junction are calculated from I-V under forward bias. C-V measurements confirmed that the prepared hetero junctions are abrupt type.


Keywords: porous silicon, HF acid


Edition: Volume 7 Issue 1, January 2018


Pages: 772 - 775



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Hussain Kazaal, Ramiz Alansari, Kadhim Aadim, Wassan Dhia, "Electrical Properties of SiO2/PSi Hetero Junction Prepared by Electrochemical Etching Process", International Journal of Science and Research (IJSR), Volume 7 Issue 1, January 2018, pp. 772-775, https://www.ijsr.net/getabstract.php?paperid=ART20176846, DOI: https://www.doi.org/10.21275/ART20176846

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