International Journal of Science and Research (IJSR)

International Journal of Science and Research (IJSR)
Call for Papers | Fully Refereed | Open Access | Double Blind Peer Reviewed

ISSN: 2319-7064


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India | Computer Science Engineering | Volume 3 Issue 6, June 2014 | Pages: 995 - 998


Test Data Generation for Basis Path Testing Using Genetic Algorithm and Clonal Selection Algorithm

Poonam Saini, Sanjay Tyagi

Abstract: Test data is needed for testing the software which can be generated automatically and manually. Manual generation of test data involves a lot of efforts. Therefore automated test data generation methods are used. To find the suitable test data for a program; optimization should be applied on test data. In this paper; two optimization techniques; Genetic Algorithm (GA) and clonal selection algorithm have been used. This paper presents how these optimization tools generate the optimized test data that satisfy the basis path testing criteria. The paper also presents the results conducted on a set of programs that evaluate effectiveness of the techniques compared to the random-testing technique.

Keywords: Basis Path Testing, Clonal Selection Algorithm, Genetic Algorithm, Software Testing, Test Data Generation

How to Cite?: Poonam Saini, Sanjay Tyagi, "Test Data Generation for Basis Path Testing Using Genetic Algorithm and Clonal Selection Algorithm", Volume 3 Issue 6, June 2014, International Journal of Science and Research (IJSR), Pages: 995-998, https://www.ijsr.net/getabstract.php?paperid=2014387, DOI: https://dx.doi.org/10.21275/2014387


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