Rate the Article: Effect of Insulator Thickness on the Barrier Height of Thin Film MIS Structure, IJSR, Call for Papers, Online Journal
International Journal of Science and Research (IJSR)

International Journal of Science and Research (IJSR)
Call for Papers | Fully Refereed | Open Access | Double Blind Peer Reviewed

ISSN: 2319-7064

Downloads: 113 | Views: 325

Research Paper | Physics Science | Iraq | Volume 4 Issue 9, September 2015 | Rating: 6.6 / 10


Effect of Insulator Thickness on the Barrier Height of Thin Film MIS Structure

Dr. Jassim Mohammed Salih Al-fahdawi


Abstract: Metal-semiconductor and metal-insulator-semiconductor thin films have been prepared using thermal evaporation technique. The value of the barrier height (bn) which was calculated using, experimental (I-V) measurements and activation energy method showed that (bn) increases with increasing insulator thickness.


Keywords: effect of insulator thickness on the barrier


Edition: Volume 4 Issue 9, September 2015,


Pages: 1295 - 1297



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