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Survey Paper | Computer Science & Engineering | India | Volume 3 Issue 11, November 2014 | Rating: 6.3 / 10
A Survey Paper on F-SIFT for Object and Copy Detection
Tanvi Gadgi, Amrit Priyadarshi
Abstract: Scale-invariant feature transform (SIFT) is succeed in such a way that it become very easy to extensively employ image local feature in different computers vision and image processing softwares. SIFT is very helpful to develop advance object classifiers. SIFT has been accepted widely for its invariant to scale, lighting and rotation in images. SIFT derived from sensitive gradient fields is not Flip Invariant.
Keywords: Flip Invariant, Scale-invariant, symmetric pattern, normalization
Edition: Volume 3 Issue 11, November 2014,
Pages: 1155 - 1156