International Journal of Science and Research (IJSR)

International Journal of Science and Research (IJSR)
Call for Papers | Fully Refereed | Open Access | Double Blind Peer Reviewed

ISSN: 2319-7064


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Survey Paper | Computer Science & Engineering | India | Volume 3 Issue 11, November 2014


A Survey Paper on F-SIFT for Object and Copy Detection

Tanvi Gadgi | Amrit Priyadarshi [3]


Abstract: Scale-invariant feature transform (SIFT) is succeed in such a way that it become very easy to extensively employ image local feature in different computers vision and image processing softwares. SIFT is very helpful to develop advance object classifiers. SIFT has been accepted widely for its invariant to scale, lighting and rotation in images. SIFT derived from sensitive gradient fields is not Flip Invariant.


Keywords: Flip Invariant, Scale-invariant, symmetric pattern, normalization


Edition: Volume 3 Issue 11, November 2014,


Pages: 1155 - 1156


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