International Journal of Science and Research (IJSR)

International Journal of Science and Research (IJSR)
Call for Papers | Fully Refereed | Open Access | Double Blind Peer Reviewed

ISSN: 2319-7064


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India | Material Science and Engineering | Volume 4 Issue 1, January 2015 | Pages: 2076 - 2079


Composition and Thickness Dependent Hall Coefficient, mobility and Carrier Concentration of Vacuum Evaporated Ag-Te Thin Films

U P Shinde

Abstract: Thin films of Ag-Te compound of varying composition and thicknesses have been formed on glass substrates employing three temperature method. The Hall voltage at different magnetic fields of various thin films was measured for different compositions and thicknesses of films. The Hall coefficient, mobility and carrier concentration of Ag-Te thin films of varying compositions and thicknesses were calculated. The phase change of Ag-Te thin films found composition dependent at room temperature and independent on thickness.

Keywords: Ag-Te, glass substrate, room temperature, thin films, composition, thickness

How to Cite?: U P Shinde, "Composition and Thickness Dependent Hall Coefficient, mobility and Carrier Concentration of Vacuum Evaporated Ag-Te Thin Films", Volume 4 Issue 1, January 2015, International Journal of Science and Research (IJSR), Pages: 2076-2079, https://www.ijsr.net/getabstract.php?paperid=SUB15785, DOI: https://dx.doi.org/10.21275/SUB15785


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