Experimental Setup Used for Fabrication and Characterisation of Thin Films
Abstract: This study presents the experimental setup and characterization methods used for the fabrication of thin films intended for semiconductor and infrared detector applications. Thin films were deposited using flash evaporation under controlled vacuum conditions to achieve compositional stability and film uniformity. Chemical composition and homogeneity were evaluated using energy dispersive X-ray analysis, confirming near-stoichiometric deposition with minimal elemental loss. Surface characteristics and film thickness were determined using ellipsometry, while optical properties, including reflectance, transmittance, and absorbance, were measured using UV-VIS-IR spectrophotometry. The combined methodology provides a reliable framework for assessing structural, compositional, and optical properties of thin films and supports their application in advanced optoelectronic materials.
Keywords: Thin films, Flash evaporation, EDAX, Ellipsometry, UV-VIS-IR spectroscopy, Semiconductor materials, Infrared detectors
How to Cite?: Desh Bandhu Sharma, "Experimental Setup Used for Fabrication and Characterisation of Thin Films", Volume 15 Issue 5, May 2026, International Journal of Science and Research (IJSR), Pages: 1158-1161, https://www.ijsr.net/getabstract.php?paperid=SR26519213923, DOI: https://dx.doi.org/10.21275/SR26519213923