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Review Paper | Material Science | Volume 15 Issue 5, May 2026 | Pages: 1040 - 1045 | India
A Literature Review on Passivation of HgCdTe (MCT) Infrared Detectors
Abstract: This review examines surface passivation approaches for HgCdTe (MCT) infrared detectors, focusing on challenges associated with surface defects, thermal instability, and interface degradation. Common passivation materials, including ZnS, SiO2, SiNx, anodic oxides, sulphides, fluorides, and photochemical oxides, are comparatively evaluated in terms of interface quality, thermal stability, dielectric behaviour, and chemical durability. The analysis indicates that while existing passivation methods offer partial benefits, significant limitations remain. Based on lattice compatibility, thermal expansion matching, optical transparency, and mechanical stability, CdTe emerges as a promising alternative passivation material for improved MCT detector performance.
Keywords: HgCdTe, MCT, infrared detectors, surface passivation, ZnS, SiO2, SiNx, anodic oxides, photochemical oxides, CdTe, semiconductor interfaces
How to Cite?: Desh Bandhu Sharma, "A Literature Review on Passivation of HgCdTe (MCT) Infrared Detectors", Volume 15 Issue 5, May 2026, International Journal of Science and Research (IJSR), Pages: 1040-1045, https://www.ijsr.net/getabstract.php?paperid=SR26515191610, DOI: https://dx.doi.org/10.21275/SR26515191610