International Journal of Science and Research (IJSR)

International Journal of Science and Research (IJSR)
Call for Papers | Fully Refereed | Open Access | Double Blind Peer Reviewed

ISSN: 2319-7064


Downloads: 104 | Views: 173

M.Tech / M.E / PhD Thesis | Electronics & Communication Engineering | India | Volume 3 Issue 9, September 2014


Efficient Hardware Utilization for Functional Broadside Test to Achieve High Fault Coverage

P. Durga Venkata Prasad | K. Tirumala Rao


Abstract: Functional broadside tests are two-pattern scan-based tests that avoid over testing by ensuring that a circuit traverses only reachable states during the functional clock cycles of a test. On-chip test generation has the added advantage that it reduces test data volume and facilitates at-speed test application. This paper shows that on-chip generation of functional broadside tests can be done using simple hardware, and can achieve high transition fault coverage forte stable circuits. With the proposed on-chip test generation method, the circuit is used for generating reachable states during test application. This alleviates the need to compute reachable states off-line


Keywords: Built-in test generation, functional broadside tests, reachable states, transition faults


Edition: Volume 3 Issue 9, September 2014,


Pages: 1938 - 1943


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