Concurrent Online Test of RFID Memories Using MBIST

Jyothi Rani Degala, Kota Nageswara Rao

Abstract: Online testing in RFID Memories is a memory testing mechanism, where the memory can be tested simultaneously with the system operation. Hence, it has instant error detection. Radio Frequency Identification (RFID) devices based on the correct operation of their memory for accurate identification of objects and delivery of transponders information. This paper presents the concurrent online test scheme for RFID memories based on Memory Built in Self Test (MBIST) architecture, the Finite State Machine (FSM) of transponder access scheme, Symmetric transparent version of March C-algorithm. Online test is achieved by modifying the transponders operation and access protocol to make use of the waiting time that transponders waste before being accessed. The solution of this paper was described in VHDL, area and timing results are simulated in Xilinx ISE 9.2i. Results show that the solution overhead is less than 0.1 %, while the timing performance allows testing up to 32-word blocks in a single waiting slot.

Keywords: Memory, Radio Frequency Identification RFID