Advancing Industrial Imaging: Contactless THz Domain Spectroscopy for Topography and Chemistry
Abstract: This research introduces a dual-functional contactless imaging technique based on terahertz time domain spectroscopy (THz-TDS) for simultaneous topographic and chemical analysis. The method was tested on pharmaceutical and food industry samples, providing accurate non-destructive measurements of thickness, roughness and chemical composition. The results demonstrate its potential for real-time quality control on industrial production lines.
Keywords: THz time domain spectroscopy, contactless imaging, topography analysis, chemical composition, non-destructive testing
How to Cite?: Thomas Vullien, Emilie Herault, Maxime Bernier, Edouard Rochefeuille, Frederic Garet, Olivier Lavastre, "Advancing Industrial Imaging: Contactless THz Domain Spectroscopy for Topography and Chemistry", Volume 13 Issue 11, November 2024, International Journal of Science and Research (IJSR), Pages: 1581-1584, https://www.ijsr.net/getabstract.php?paperid=SR241119135215, DOI: https://dx.doi.org/10.21275/SR241119135215