International Journal of Science and Research (IJSR)

International Journal of Science and Research (IJSR)
Call for Papers | Fully Refereed | Open Access | Double Blind Peer Reviewed

ISSN: 2319-7064


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Research Paper | Electrical & Electronics Engineering | India | Volume 9 Issue 12, December 2020 | Popularity: 6.6 / 10


     

Travelling Wave based Fault Location for Teed Transmission Network using S-transform Technique

Divya Gutam, S. K. Nazeer, Kumarraja.A


Abstract: A Travelling predicated fault locator approach is implemented in this paper for the teed transmission network. The work is similar to the fault location for teed circuits for unsynchronized measurements in [12]. Advantage of S-transform is more effective then wavelet transform. The stock well transforms (S-Transform) technique is utilized for the extraction of high-frequency fault transients in order to confine the peregrinate time of the transients along the monitored lines between the fault points and relays. The fault location is resolute by taking time distinction between the advent of the rearward and forward travelling waves. The algorithm gives precise results for the three-terminal lines under different fault conditions. The performance of the algorithm is tested in a MATLAB environment.


Keywords: Transmission lines, teed circuits, fault location, travelling waves, S-transform


Edition: Volume 9 Issue 12, December 2020


Pages: 1773 - 1777



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Divya Gutam, S. K. Nazeer, Kumarraja.A, "Travelling Wave based Fault Location for Teed Transmission Network using S-transform Technique", International Journal of Science and Research (IJSR), Volume 9 Issue 12, December 2020, pp. 1773-1777, https://www.ijsr.net/getabstract.php?paperid=SR201219095400, DOI: https://www.doi.org/10.21275/SR201219095400

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