International Journal of Science and Research (IJSR)

International Journal of Science and Research (IJSR)
Call for Papers | Fully Refereed | Open Access | Double Blind Peer Reviewed

ISSN: 2319-7064

Downloads: 126 | Views: 159

Research Paper | Material Science | Iraq | Volume 6 Issue 12, December 2017

Study the Effect of Annealing Temperature and Thickness on the Structural, Optical Properties of the (CdTe) Thin Films

D. Ramiz Ahmed Mohamed | Dr. Fallah Ibrahim Mustafa | Dhuha Kareem Harfash

Abstract: Thin films of CdTe were prepared in the thickness (500 and 1000 nm) on the glass substrate by vacuum evaporation technique at room temperature then put in different annealing temperatures (300, 373, 473, 573) K for one hour. From the study Structural properties of the thin films by the X - ray diffraction, we found polycrystalline nature and with a preferred orientation along [111] cubic and increasing density when increasing the annealing temperature and found the new peaks at the annealing temperature of (573) K for CdO. The Transmittance spectrum was recorded as a function of wavelength range (500-1100) nm. The energy gap increase when the increase thickness and annealing temperature.

Keywords: thin films, CdTe, thermal evaporation technique, X - ray diffraction

Edition: Volume 6 Issue 12, December 2017,

Pages: 366 - 370

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