International Journal of Science and Research (IJSR)
Call for Papers | Fully Refereed | Open Access | Double Blind Peer Reviewed

ISSN: 2319-7064

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Resistivity XRD, SEM, EDAX of CU/TiN /Si Structure Using Scanning Magnetron Sputtered TiN as Diffusion Barrier

Dr. A. S. Pharswan

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Last updated: 2026-10-06 06:22:39

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