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Research Paper, Electronics & Communication Engineering, India, Volume 3 Issue 3, March 2014
Pages: 393 - 396Differential Fault Analysis on High Throughput AES
T. Soundarya
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International Journal of Science and Research (IJSR)
Call for Papers | Fully Refereed | Open Access | Double Blind Peer Reviewed
ISSN: 2319-7064
Downloads: 134 | Weekly Hits: ⮙1 | Monthly Hits: ⮙1
Research Paper, Electronics & Communication Engineering, India, Volume 3 Issue 3, March 2014
Pages: 393 - 396T. Soundarya