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Research Paper, Electronics & Communication Engineering, India, Volume 2 Issue 9, September 2013
Pages: 119 - 123Concurrent Online Test of RFID Memories Using MBIST
Jyothi Rani Degala, Kota Nageswara Rao
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International Journal of Science and Research (IJSR)
Call for Papers | Fully Refereed | Open Access | Double Blind Peer Reviewed
ISSN: 2319-7064
Downloads: 150
Research Paper, Electronics & Communication Engineering, India, Volume 2 Issue 9, September 2013
Pages: 119 - 123Jyothi Rani Degala, Kota Nageswara Rao