International Journal of Science and Research (IJSR)

International Journal of Science and Research (IJSR)
Call for Papers | Fully Refereed | Open Access | Double Blind Peer Reviewed

ISSN: 2319-7064


Downloads: 113

Research Paper | Physics Science | Iraq | Volume 6 Issue 5, May 2017


Theoretical Treatment and Investigation of the Expectation Electronic Current of Metal-Semiconductor System

Hadi J.M [2] | Al-agealy [2] | Taif Saad Al Maadhede


Abstract: The aim of this research is theoretical study and investigation of the electronic properties cross the metal-semiconductor contacts devices depending on the evaluation the expectation values of electronic current transfer. Barrier Potential heights have been characterized the electronic properties cross interface of metal-semiconductor contacts. Continuum energy levels are assume to the metal-semiconductor devices to fulfelment an ideal contacts at interface for the two difrent solid material states. Dipoles effect on the energies of transfer and the barrier potential heights could be presented in real contacts at metal-semiconductor devices. The expectation of electronic current and transfer barrier potential heights have been evaluated by using the theoretical method with transfer energy is given by the optical and statical dielectric constants of the two material. A MATLAB program designed to predict the expectation electronic current transfer.


Keywords: Electronic Properties, Metal-Semiconductor


Edition: Volume 6 Issue 5, May 2017,


Pages: 1886 - 1890


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How to Cite this Article?

Hadi J.M, Al-agealy, Taif Saad Al Maadhede, "Theoretical Treatment and Investigation of the Expectation Electronic Current of Metal-Semiconductor System", International Journal of Science and Research (IJSR), Volume 6 Issue 5, May 2017, pp. 1886-1890, https://www.ijsr.net/get_abstract.php?paper_id=ART20173559

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