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Research Paper | Physics Science | India | Volume 3 Issue 3, March 2014
XRD, TEM Techniques for Nano Crystalline Thin Films
Abstract: There are number of techniques to analyze and characterize any material in nano particle. Thin films and bulk form. In the present work to determine the purity, stoichiometric composition, structural determination microscopy, to get particle size and shape, optical studies, thermal studies of nano particles and thin films. There are number of techniques such as EDAX (Energy Dispersive Analysis of X-ray) XRD (X-Ray diffretometer), TEM (Transmission Electron Microscopy), Ruman Spectroscopy, TGA (Thermogravimetric Analysis), UV-VIS-NIR Spectrometer.
Keywords: Optical, chemical properties, cancer research, condenser lens, Bruggs law
Edition: Volume 3 Issue 3, March 2014,
Pages: 503 - 504
Similar Articles with Keyword 'Optical'
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Research Paper, Physics Science, Iraq, Volume 12 Issue 2, February 2023
Pages: 1163 - 1166Absorption Spectrum Analysis to Predicted and Calculated the Spectroscopic Properties of Pr:SiO2
Hanaa M. Yaseen
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Research Paper, Physics Science, India, Volume 12 Issue 10, October 2023
Pages: 983 - 985Investigations of the Optical Properties of Manganese-Doped Zinc Ferrite Nanomaterials
Avinash Chand Yadav | Santosh Kumar [50]