International Journal of Science and Research (IJSR)

International Journal of Science and Research (IJSR)
Call for Papers | Fully Refereed | Open Access | Double Blind Peer Reviewed

ISSN: 2319-7064


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Research Paper | Electronics & Communication Engineering | India | Volume 3 Issue 11, November 2014


Ternary Logic Gates and Ternary SRAM Cell Implementation in VLSI

Punnam Nagaraju | Neerati Vishnuvardhan


Abstract: : This paper presents Very Large Scale Integration (VLSI) design and simulation of a ternary logic gates and CMOS ternary SRAM cell. The Simple Ternary Inverter, Positive Ternary Inverter and Negative Ternary Inverter are designed in 180nm technology. The Ternary NAND Gate and Ternary NOR Gate are also designed and simulated. The ternary SRAM consists of crosscoupled ternary inverters. SPICE simulations confirmed that the functional behavior of the READ and WRITE operations is correct


Keywords: Multiple-valued logic MVL, CMOS Ternary Logic, Ternary SRAM, Simple Ternary Inverter STI, Positive Ternary Inverter PTI, Negative Ternary Inverter NTI


Edition: Volume 3 Issue 11, November 2014,


Pages: 1920 - 1824


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How to Cite this Article?

Punnam Nagaraju, Neerati Vishnuvardhan, "Ternary Logic Gates and Ternary SRAM Cell Implementation in VLSI", International Journal of Science and Research (IJSR), Volume 3 Issue 11, November 2014, pp. 1920-1824, https://www.ijsr.net/get_abstract.php?paper_id=13111402

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