Research Paper | Physics Science | Iraq | Volume 4 Issue 9, September 2015
Effect of Insulator Thickness on the Barrier Height of Thin Film MIS Structure
Abstract: Metal-semiconductor and metal-insulator-semiconductor thin films have been prepared using thermal evaporation technique. The value of the barrier height (bn) which was calculated using, experimental (I-V) measurements and activation energy method showed that (bn) increases with increasing insulator thickness.
Keywords: effect of insulator thickness on the barrier
Edition: Volume 4 Issue 9, September 2015,
Pages: 1295 - 1297
How to Cite this Article?
Dr. Jassim Mohammed Salih Al-fahdawi, "Effect of Insulator Thickness on the Barrier Height of Thin Film MIS Structure", International Journal of Science and Research (IJSR), Volume 4 Issue 9, September 2015, pp. 1295-1297, https://www.ijsr.net/get_abstract.php?paper_id=SUB158265
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