International Journal of Science and Research (IJSR)

International Journal of Science and Research (IJSR)
Since Year 2012 | Open Access | Double Blind Reviewed

ISSN: 2319-7064




Downloads: 113

Research Paper | Physics Science | Iraq | Volume 4 Issue 9, September 2015


Effect of Insulator Thickness on the Barrier Height of Thin Film MIS Structure

Dr. Jassim Mohammed Salih Al-fahdawi [2]


Abstract: Metal-semiconductor and metal-insulator-semiconductor thin films have been prepared using thermal evaporation technique. The value of the barrier height (bn) which was calculated using, experimental (I-V) measurements and activation energy method showed that (bn) increases with increasing insulator thickness.


Keywords: effect of insulator thickness on the barrier


Edition: Volume 4 Issue 9, September 2015,


Pages: 1295 - 1297


How to Cite this Article?

Dr. Jassim Mohammed Salih Al-fahdawi, "Effect of Insulator Thickness on the Barrier Height of Thin Film MIS Structure", International Journal of Science and Research (IJSR), Volume 4 Issue 9, September 2015, pp. 1295-1297, https://www.ijsr.net/get_abstract.php?paper_id=SUB158265

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