International Journal of Science and Research (IJSR)

International Journal of Science and Research (IJSR)
Since Year 2012 | Open Access | Double Blind Reviewed

ISSN: 2319-7064




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Research Paper | Material Science and Engineering | India | Volume 4 Issue 1, January 2015


Composition and Thickness Dependent Hall Coefficient, mobility and Carrier Concentration of Vacuum Evaporated Ag-Te Thin Films

U P Shinde


Abstract: Thin films of Ag-Te compound of varying composition and thicknesses have been formed on glass substrates employing three temperature method. The Hall voltage at different magnetic fields of various thin films was measured for different compositions and thicknesses of films. The Hall coefficient, mobility and carrier concentration of Ag-Te thin films of varying compositions and thicknesses were calculated. The phase change of Ag-Te thin films found composition dependent at room temperature and independent on thickness.


Keywords: Ag-Te, glass substrate, room temperature, thin films, composition, thickness


Edition: Volume 4 Issue 1, January 2015,


Pages: 2076 - 2079


How to Cite this Article?

U P Shinde, "Composition and Thickness Dependent Hall Coefficient, mobility and Carrier Concentration of Vacuum Evaporated Ag-Te Thin Films", International Journal of Science and Research (IJSR), Volume 4 Issue 1, January 2015, pp. 2076-2079, https://www.ijsr.net/get_abstract.php?paper_id=SUB15785

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