International Journal of Science and Research (IJSR)

International Journal of Science and Research (IJSR)
Since Year 2012 | Open Access | Double Blind Reviewed

ISSN: 2319-7064




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Research Paper | Physics Science | India | Volume 4 Issue 3, March 2015


Electrical Properties of CDS Thin Films by Vacuum Evaporation Deposition

Zanje Sanjay Sopan | Dhanawade Reshma Narayan


Abstract: Cadmium Sulfide thin films have been deposited on to well cleaned glass substrate in a vacuum of 10-6 Torr. The thickness of the films has been determined by quartz crystal monitor method. The electrical resistivity measurements were performed at room temperature by four probe method and it shows CdS films with high resistivity. I-V characteristics analyzed with various thickness.


Keywords: CdS, Electrical Properties, Electrical resistivity


Edition: Volume 4 Issue 3, March 2015,


Pages: 1708 - 1710


How to Cite this Article?

Zanje Sanjay Sopan, Dhanawade Reshma Narayan, "Electrical Properties of CDS Thin Films by Vacuum Evaporation Deposition", International Journal of Science and Research (IJSR), Volume 4 Issue 3, March 2015, pp. 1708-1710, https://www.ijsr.net/get_abstract.php?paper_id=SUB152199

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