International Journal of Science and Research (IJSR)

International Journal of Science and Research (IJSR)
Since Year 2012 | Open Access | Fully Refereed | Peer Reviewed

ISSN: 2319-7064




Downloads: 113

Review Papers | Electronics & Communication Engineering | India | Volume 3 Issue 11, November 2014


A Novel Approach to Electromagnetic Interference Shielding for Cell Phones

Vaibhav Kasar | Aditya Pawar


Abstract: The electromagnetic radiations penetrate through the human body. These radiations of cell phones cause heating of body fluids resulting in de-hydration of brain cells and surrounding tissues. This is the major health problem in the era of communication. This paper discusses different methodologies for electromagnetic shielding that will inhibit the penetration of severe electromagnetic radiations through the brain. These methodologies cover shielding by aluminium foil/mesh, thin graphene layer, combination of polystyrene and carbon nanotubes, layers of non-metal and dielectric.


Keywords: Electromagnetic Interference, Electromagnetic Shielding, Carbon nanotubes


Edition: Volume 3 Issue 11, November 2014,


Pages: 1869 - 1872

A Novel Approach to Electromagnetic Interference Shielding for Cell Phones


How to Cite this Article?

Vaibhav Kasar, Aditya Pawar, "A Novel Approach to Electromagnetic Interference Shielding for Cell Phones", International Journal of Science and Research (IJSR), https://www.ijsr.net/get_abstract.php?paper_id=OCT141294, Volume 3 Issue 11, November 2014, 1869 - 1872, #ijsrnet

How to Share this Article?

Enter Your Email Address




Similar Articles with Keyword 'Carbon nanotubes'

Downloads: 104

Review Papers, Electronics & Communication Engineering, India, Volume 4 Issue 3, March 2015

Pages: 2183 - 2185

Carbon Nanotubes Field Effect Transistor: A Review

Shaifali Ruhil [2] | Jyoti Sehgal | Komal Rohilla [2]

Share this Article

Downloads: 136

Research Paper, Electronics & Communication Engineering, India, Volume 4 Issue 5, May 2015

Pages: 498 - 500

CNTFET Based Circuit Performance over CMOS in Logic Gates

Mohammad Farhan [2]

Share this Article


Top