International Journal of Science and Research (IJSR)

International Journal of Science and Research (IJSR)
Since Year 2012 | Open Access | Fully Refereed | Peer Reviewed

ISSN: 2319-7064




Downloads: 100

M.Tech / M.E / PhD Thesis | Electronics & Communication Engineering | India | Volume 5 Issue 5, May 2016


Realization of Programmable PRPG with Enhanced Fault Coverage Gradient

Lakshmi Asokan | Jeena Maria Cherian


Abstract: This paper describes a low power programmable pseudorandom pattern generator with desired toggling level and also enhanced fault coverage compared with other BIST based on PRPG. It comprised of finite state machine LFSR driving a phase shifter and it allows the device to produce binary sequence with preselected toggling activity. Generator is automatically controlled providing easy and precise tuning. Furthermore, this paper introduces a test compression method to avoid repeated pattern generation for testing the same device. The main highlight of this paper is to reduce the test data volume and test data memory.


Keywords: BIST, low power test, PRPG, test data volume compression


Edition: Volume 5 Issue 5, May 2016,


Pages: 2286 - 2288

Realization of Programmable PRPG with Enhanced Fault Coverage Gradient


How to Cite this Article?

Lakshmi Asokan, Jeena Maria Cherian, "Realization of Programmable PRPG with Enhanced Fault Coverage Gradient", International Journal of Science and Research (IJSR), https://www.ijsr.net/get_abstract.php?paper_id=NOV163979, Volume 5 Issue 5, May 2016, 2286 - 2288, #ijsrnet

How to Share this Article?

Enter Your Email Address




Similar Articles with Keyword 'BIST'

Downloads: 105

Research Paper, Electronics & Communication Engineering, India, Volume 4 Issue 5, May 2015

Pages: 2561 - 2564

Statistical Simulation for BIST Architecture using Cognitive Principles

Shradha Khemka

Share this Article

Downloads: 109

Case Studies, Electronics & Communication Engineering, India, Volume 4 Issue 2, February 2015

Pages: 1937 - 1941

Re-Configurable Built In Self Repair scheme in Ram for Yield Improvement

Tessy M John | Dhanya Oommen

Share this Article


Top