Study the Effect of Annealing Temperature and Thickness on the Structural, Optical Properties of the (CdTe) Thin Films
International Journal of Science and Research (IJSR)

International Journal of Science and Research (IJSR)
www.ijsr.net | Open Access | Fully Refereed | Peer Reviewed International Journal

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Research Paper | Material Science | Iraq | Volume 6 Issue 12, December 2017

Study the Effect of Annealing Temperature and Thickness on the Structural, Optical Properties of the (CdTe) Thin Films

D. Ramiz Ahmed Mohamed, Dr. Fallah Ibrahim Mustafa, Dhuha Kareem Harfash

Thin films of CdTe were prepared in the thickness (500 and 1000 nm) on the glass substrate by vacuum evaporation technique at room temperature then put in different annealing temperatures (300, 373, 473, 573) K for one hour. From the study Structural properties of the thin films by the X - ray diffraction, we found polycrystalline nature and with a preferred orientation along [111] cubic and increasing density when increasing the annealing temperature and found the new peaks at the annealing temperature of (573) K for CdO. The Transmittance spectrum was recorded as a function of wavelength range (500-1100) nm. The energy gap increase when the increase thickness and annealing temperature.

Keywords: thin films, CdTe, thermal evaporation technique, X - ray diffraction

Edition: Volume 6 Issue 12, December 2017

Pages: 366 - 370

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How to Cite this Article?

D. Ramiz Ahmed Mohamed, Dr. Fallah Ibrahim Mustafa, Dhuha Kareem Harfash, "Study the Effect of Annealing Temperature and Thickness on the Structural, Optical Properties of the (CdTe) Thin Films", International Journal of Science and Research (IJSR), https://www.ijsr.net/search_index_results_paperid.php?id=ART20178579, Volume 6 Issue 12, December 2017, 366 - 370

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