Test Data Generation for Basis Path Testing Using Genetic Algorithm and Clonal Selection Algorithm
International Journal of Science and Research (IJSR)

International Journal of Science and Research (IJSR)
www.ijsr.net | Open Access | Fully Refereed | Peer Reviewed International Journal

ISSN: 2319-7064

Downloads: 114

Research Paper | Computer Science & Engineering | India | Volume 3 Issue 6, June 2014

Test Data Generation for Basis Path Testing Using Genetic Algorithm and Clonal Selection Algorithm

Poonam Saini, Sanjay Tyagi

Test data is needed for testing the software which can be generated automatically and manually. Manual generation of test data involves a lot of efforts. Therefore automated test data generation methods are used. To find the suitable test data for a program; optimization should be applied on test data. In this paper; two optimization techniques; Genetic Algorithm (GA) and clonal selection algorithm have been used. This paper presents how these optimization tools generate the optimized test data that satisfy the basis path testing criteria. The paper also presents the results conducted on a set of programs that evaluate effectiveness of the techniques compared to the random-testing technique.

Keywords: Basis Path Testing, Clonal Selection Algorithm, Genetic Algorithm, Software Testing, Test Data Generation

Edition: Volume 3 Issue 6, June 2014

Pages: 995 - 998

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How to Cite this Article?

Poonam Saini, Sanjay Tyagi, "Test Data Generation for Basis Path Testing Using Genetic Algorithm and Clonal Selection Algorithm", International Journal of Science and Research (IJSR), https://www.ijsr.net/search_index_results_paperid.php?id=2014387, Volume 3 Issue 6, June 2014, 995 - 998

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