International Journal of Science and Research (IJSR)

International Journal of Science and Research (IJSR)
www.ijsr.net | Most Trusted Research Journal Since Year 2012

ISSN: 2319-7064



Review Papers | Industrial Engineering | India | Volume 3 Issue 6, June 2014

A Review on Finite Element Analysis of Free Fall Drop Test on Mobile Phone

Gurjinder Singh, Jaswinder Singh

: Present paper discusses the working methodologies used for drop test. Engineers widely used physical testing method to investigate the behaviour of cellular phone during drop test. It is very costly; time consuming and complex. Finite element analysis provides numerical models without spent so much money on physical testing methods. Drop test simulation is one of the important tool uses for the impact behaviour study of cellular phones. It identifies weak design points during the impact behaviour of cellular phone.

Keywords: Finite Element Analysis, LS Dyna, Product & Broad Level, Explicit vs Implicit

Edition: Volume 3 Issue 6, June 2014

Pages: 243 - 345


How to Cite this Article?

Gurjinder Singh, Jaswinder Singh, "A Review on Finite Element Analysis of Free Fall Drop Test on Mobile Phone", International Journal of Science and Research (IJSR), https://www.ijsr.net/search_index_results_paperid.php?id=2014232, Volume 3 Issue 6, June 2014, 243 - 345

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