Research Paper | Physics Science | India | Volume 3 Issue 2, February 2014
Different Techniques for CdS Nano Particles and Nanocrystalline Thin Films
Abstract: An appropriate characterization of any material plays a very crucial role in determining its various properties. A number of techniques can be used to analyze and characterize any material in nanoparticle, thin films and bulk form. In the present work to determine the purity, stoichiometric composition, structural determination, microscopy to get particle size and shape, optical studies, thermal studies of CdS nanoparticles and CdS thin films, In CdS thin films we used techniques such as EDMX (Energy dispersive analysis of X-rays), XRD (X-ray diffractometer), TEM (Transmission electron microscopy).
Keywords: scanning electron microscope, X-Ray detector, Pulse generator, Production of X-ray, charge pulses, surface science technique
Edition: Volume 3 Issue 2, February 2014,
Pages: 381 - 382
How to Cite this Article?
Paresh V. Modh, "Different Techniques for CdS Nano Particles and Nanocrystalline Thin Films", International Journal of Science and Research (IJSR), https://www.ijsr.net/get_abstract.php?paper_id=2013975, Volume 3 Issue 2, February 2014, 381 - 382, #ijsrnet
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