Research Paper | Physics Science | India | Volume 3 Issue 3, March 2014
XRD, TEM Techniques for Nano Crystalline Thin Films
Paresh V. Modh
Abstract: There are number of techniques to analyze and characterize any material in nano particle. Thin films and bulk form. In the present work to determine the purity, stoichiometric composition, structural determination microscopy, to get particle size and shape, optical studies, thermal studies of nano particles and thin films. There are number of techniques such as EDAX (Energy Dispersive Analysis of X-ray) XRD (X-Ray diffretometer), TEM (Transmission Electron Microscopy), Ruman Spectroscopy, TGA (Thermogravimetric Analysis), UV-VIS-NIR Spectrometer.
Keywords: Optical, chemical properties, cancer research, condenser lens, Bruggs law
Edition: Volume 3 Issue 3, March 2014,
Pages: 503 - 504
How to Cite this Article?
Paresh V. Modh, "XRD, TEM Techniques for Nano Crystalline Thin Films", International Journal of Science and Research (IJSR), https://www.ijsr.net/get_abstract.php?paper_id=20131228, Volume 3 Issue 3, March 2014, 503 - 504
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